Summary:

In the papers below we describe development and applications of novel transmission ellipsometers worldwide first build by our team. This brand-new branch in ellipsometry was developed by us, because we needed quantified testing of high performance-laser crystals in transmission. Such crystals are applied for instance in our precise force measurements, see subpage (3/8).

Note: compared with usual reflection ellipsometers the transmission ellipsometers need higher effort. That is because  transmission ellipsometers measure as well double refraction, polarization depending damping  as main axes orientation and rotation angle in the beam path of the laser. Knowledge of these 4 magnitudes is a must in our quality checking of loaded and unloaded laser crystals, too.

The convincing features of transmission ellipsometers led to a successful start-up of a very competent crew member, the later founder of Dr. Riss Ellipsometrbau (DRE). To day transmission ellipsometers are established instruments, because not only transparent crystals but also optical fibers, integrated optics and other optical tramsmissen devices and components can be tested.

Read our papers!

TRANSMISSION ELLIPSOMETRIE - TRANSMISSIONSELLIPSOMETRIE

Zhang S.; Holzapfel, W.

Orthogonal Polarization in Lasers – Physical Phenomena and Engineering Applications*
Wiley 2014 ISBN 978-1-118-34651-8 (Adobe PDF) – ISBN 978-1-118-34652-5 (ePub) – ISBN 978-1-118-34653-2 (MobiPocket) – ISBN 978-1-118-34649-5 (cloth) ; Tsinghua University Press 2014, ISBN 978-7-302-34951-8. 434 pages including Foreword, Preface, Introduction, Index.

See Part Four, Applications of Orthogonally Polarized Lasers: Introduction and Background of Applications (Main Chapter11), Measurements of Optical Anisotropies by Orthogonally Polarized Lasers (Main Chapter 12), Displacement Measurement by Orthogonally Polarized Lasers (Main Chapter 13), Force and Pressure Measurement by Means of Photoelastic Nd:YAG Lasers (Main Chapter 14), Measurements via Translation/Rotation of Intracavity Quartz Crystals (Main Chapter 15), Combined Magnetometer/Rate Gyro Transducers by Four-Frequency Ring Lasers (Main Chapter 16), Further Applications of Orthogonally Polarized Lasers (Main Chapter 17), Conclusions of Part Four (Main Chapter 18), References.

Holzapfel, W.; Neuschaeffer-Rube, U.; Braasch J.; Mahdavi N.

Ellipsometric determination of polarization-dependent transmission in resonant feedback systems
Applied Optics 46, pp.1416-1428 (2007)

Holzapfel, W.; Braasch J.; Mahdavi N.; Riss, U.; Suske, M.

Zur Ellipsometrie offener und rückgekoppelter optisch anisotroper Systeme – Ellipsometry of open loop and closed loop anisotropic optical systems
Bericht des Institutes für Mess-und Automatisierungstechnik der Universität Kassel IMAT- MT-17, Kassel 2006, 171 S., ISBN 3-88122-X, ISSN 0939-5628

Holzapfel, W.; Neuschaefer-Rube, St.; Neuschaefer-Rube, U. .

Resonatorinterne Ellipsometrie
Bericht des Institutes für Mess-und Automatisierungstechnik der Universität Kassel IMAT- MT-15, Kassel 1997, 95 S., ISBN 3-88122-926-4, ISSN 0939-5628

Holzapfel, W.; Neuschaefer-Rube, U.; Neuschaefer-Rube, St.

The photoelastic microellipsometer – a new tool for high resolution force vector measurements
SPIE-Proceedings of the International Symposium on Polarization Analysis and Applications to Device Technology, 12-14 June 1996, Yokohama, Japan, Vol. 2873, pp. 176-179, ISBN 0-8194-2271-1

Holzapfel, W.; Neuschaefer-Rube, St.

Measurements of the ellipsometric parameters of optical components inside an active laser
SPIE-Proceedings of the International Symposium on Polarization Analysis and Applications to Device Technology, 12-14 June 1996, Yokohama, Japan, Vol. 2873, pp. 133-136, ISBN 0-8194-2271-1

Holzapfel, W.; Neuschaefer-Rube, St.

Transmission ellipsometry with intracavity component under test
Proceedings of XIII IMEKO World Congress, Torino, Sep. 5-9, 1994, Vol. 2: Diagnostics, pp. 1218-1223

Holzapfel, W.; Neuschaefer-Rube, St.; Neuschaefer-Rube, U.

Intracavity Transmission Ellipsometry for Optically Anisotropic Components
Applied Optics 32, 30, pp. 6022-6031 (1993)

Holzapfel, W.; Ye, C.

Transmission Ellipsometry of Δ and ϕ based on Intensity Quotient Measurements
Optik 91, 2, pp. 53-60 (1992)

Holzapfel, W.; Riß, U.

Zur meßtechnischen Charakterisierung integriert-optischer Strukturen.
Bericht des Institutes für Mess-und Automatisierungstechnik der Universität Kassel, IMAT- MT 3, 41 S. Kassel 1991, ISBN 3-88122-544-7, ISSN 0939-5628

Holzapfel, W.; Riß, U.

High Precision Measurement of Glass Sample Properties by Transmission Ellipsometry.
SPIE-Proceedings, Vol. 970: Properties and Characteristics of Optical Glass, pp. 48-61, San Diego (1988) ISBN 0-8194-0005-X

Holzapfel, W.; Riß, U.

Investigations on the Quality of Optical Glasses, Photoelastic Modulators, Optical Fibres and Integrated Optics by an Automatic Transmission Ellipsometer
Proceedings of IMEKO XI, 1988, Houston, Vol.: Metrology, pp. 7-33, ISBN 1-55617-143-9

Riß, U., Holzapfel, W.

Transmissionsellipsometer zur Vermessung der Anisotropien von Substraten, Monomode-Fasern und integrierten Optiken
88. Tagungsband der Deutschen Gesellschaft für angewandte Optik, S. 80, Berchtesgaden (1987)

Holzapfel, W.; Riß, U.

Computer based High Resolution Transmission Ellipsometry.
Applied Optics 26, 1, pp. 145-152 (1987)

Holzapfel, W., Riß, U.

Automatisches Ellipsometer für hochgenaue Transmissionsmessungen an optisch doppelbrechenden Komponenten und Systemen
Technisches Messen 53, 10, pp. 384-389 (1986)

Holzapfel, W.; Riß, U.

Automatisches Transmissionsellipsometer.
VDI-Berichte 566: Automatisierte Meßsysteme, pp. 261-272 (1985) ISBN 3-18-090566-2